: UV plastic strips are placed over the resin. A UV lamp is used to cure the resin, moving upward every 5 minutes until the entire length is hardened.
The Esprit Edge Crack is a characteristic reliability failure of certain amorphous silicon flexible modules, rooted in thermomechanical stress at the laser-cut edge combined with moisture-driven corrosion. While modern PV designs (e.g., edge deletion, advanced encapsulation) have reduced its prevalence, legacy Esprit installations continue to exhibit this failure. Detection via EL imaging and proactive edge sealing are the most effective management strategies. For new flexible PV designs, eliminating exposed scribe lines and using robust edge overmolding is essential to prevent this class of defect. esprit edge crack
| Parameter | Esprit (a-Si) | CIGS (e.g., MiaSolé) | Organic PV | |-----------|--------------|----------------------|-------------| | Edge crack susceptibility | High | Medium | Very High | | Primary cause | CTE + moisture | Scribe line weakness | Pinhole oxidation | | Progression speed | Slow (months) | Medium (weeks) | Fast (days) | | Field repairable? | Partial (Stage 1-2) | Rarely | No | : UV plastic strips are placed over the resin
| Stage | Electrical Symptom | Visual Sign | Progression Time | |-------|--------------------|-------------|------------------| | | No measurable loss | None – crack < 10 µm | — | | 1 (Propagation) | Slight decrease in Isc (1-3%) | Hairline visible under microscope at edge | 3-6 months | | 2 (Shunting) | Drop in Voc; localized hot spot (ΔT > 10°C) | Dark brown line entering cell area | 6-12 months | | 3 (Delamination) | Power loss >20%; potential mismatch | Edge lifting, visible corrosion products | 12-18 months | While modern PV designs (e
Empirical observations and manufacturer technical bulletins (circa 2010–2015) identify three primary causes: